Hi Dwight, in accordance with Peter (and by my long term experinece) - I
do not use algorithms (even if the RIP contains it). Much better is have
printed a good TAC target, make some measurement with a good handheld, and
a carefully examine the material and overprint patches.
Cheers, Kamil,
On Tue, Oct 23, 2018 at 12:50 AM Peter Kleinheider <peter(a)inpetto.cc> wrote:
Dwight,
For ink limit, we work with values from experience. It depends on various
variables like the used ink, the substrate, the resolution, the printing
speed, usage of light inks, ...
We have not yet found an algorithm that calculates it based on the
linearized single channels. Hence we use a TAC chart when we have a new
combination of parameters. As printed ares above the maximum ink threshold
may have "artefacts" that cannot get caught using a spectrophotopmeter, a
user has to decide what limit to set. Important: it shall define the
maximum TAC that can get printed on that substrate. A further reduction to
less TAC should be done when generating the ICC profile.
Happy to hear about other experiences.
best
Peter
On 22.10.2018, at 13:31, Dwight Kelly
<dkelly(a)apago.com> wrote:
Hello,
I’m looking for references on device linearization techniques and
algorithms.
Have an inkjet textile printer that’s proving difficult to characterize
because of
the amount of ink it lays down. Don’t want to just pick an
arbitrary ink limit. Would rather calculate it empirically.
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